Breakthrough in SThM was achieved through innovative probe design
- Silicon cantilever with hollow SiO₂ tip integrated with 50 nm thermocouple at the apex of the tip
- Thermal isolation of the sensor allows accurate measurement of sample temperatures- 0.01 °C sensitivity
- Choice of materials and probe design allow measuring high temperatures- up to 700 °C
- Three types of VTP probes:
- VTP-200 for Tapping™/Peak Force Tapping™/Contact
- VTP-500 for Contact mode
- VTP-375 for temperature mapping mode/thermal conductivity mode
- Design also allows imaging in temperature mapping mode (TMM) or conductivity mapping mode (CMM) by changing the position of AFM laser on the cantilever
- Probes are pre-mounted on adapter boards specific to AFM systems
Parameter Nominal value VTP-200 VTP-500 VTP-375 k (N/m) 9.9 0.63 1.41 f (kHz) 107 17 31 Length (µm) 200 500 375 Width (µm) 50 50 50 Thickness (µm) 3.5 3.5 3.5 Height (µm) 16 16 16
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